Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact / Souvik Mahapatra, editor.
This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices areas. NBTI continues to remain as an important reliability issue for CMOS transistors and circuits. Development of NBTI resilient technology...
Full description
Saved in: