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220409s2021 xx o ||| 0 eng d |
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|b eng
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|a 1306065448
|a 1309058172
|a 1310337907
|a 1311325010
|a 1356115614
|a 1396901689
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|a 9781643682471
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|a 1643682474
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|a (OCoLC)1311341048
|z (OCoLC)1306065448
|z (OCoLC)1309058172
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|z (OCoLC)1396901689
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| 050 |
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4 |
|a QC81
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| 049 |
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|a HCDD
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| 100 |
1 |
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|a Milton, M. J. T.
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| 245 |
1 |
0 |
|a New Frontiers for Metrology
|h [electronic resource].
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| 260 |
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|a :
|b IOS Press, Incorporated,
|c 2021.
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| 300 |
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|a 1 online resource (480 p.).
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Proceedings of the International School of Physics Enrico Fermi Ser. ;
|v v.206
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| 500 |
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|a Description based upon print version of record.
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| 505 |
0 |
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|a Intro -- Title Page -- Contents -- M.J.T. Milton, D.S. Wiersma, C.J. Williams and M. Sega -- Preface -- Course group shot -- Andrew J. Lewis -- Realising the metre -- Andrew J. Lewis -- Dimensional metrology in practice -- E. Massa -- Avogadro, Planck and the kilogram redefinition -- Juris Meija -- Traceability in chemical measurements: The role of data analysis -- Juris Meija -- Atomic weights of the elements: From measurements to the Periodic Table -- S.M. Judge and D.T. Burns -- Metrology for the safe and effective use of ionizing radiation. Part 1: Radiation dosimetry -- Carl J. Williams -- The SI from platinum to Planck: The biggest revolution in metrology since the French Revolution -- Ekkehard Peik -- Optical atomic clocks and tests of fundamental principles -- Paolo Brenni -- The production and trade of scientific instruments (1750-1950) -- Martin J.T. Milton and Celine Fellag Ariouet -- The metric system, the Metre Convention and the BIPM -- Gael Obein -- The measurement of appearance -- S.M. Judge -- Metrology for the safe and effective use of ionizing radiation. Part 2: Radioactivity -- A. Henson -- Metrological traceability: A global perspective -- Steven Westwood, Gustavo Martos, Norbert Stoppacher and Robert Wielgosz -- Metrological applications of NMR and qNMR in organic analysis -- Michela Sega -- Reference Materials: Preparation, homogeneity, stability and value assignment -- Patrizia Tavella -- Analysing and obtaining statistical information on time varying quantities -- Patrizia Tavella -- Timekeeping and navigation systems -- W. Bich -- Measurement uncertainty: Historical perspective, present status and foreseeable future -- Carl J. Williams, John H. Lehman and Christopher W. Oates -- The future of metrology -- M.-O. Andre -- Fundamentals and applications in electrical metrology -- Posters.
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8 |
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|a Benjamin A. Bircher -- Computed tomography for dimensional metrology: Design considerations for high-resolution CT systems -- H. Salouros and M. Collins -- Application of stable isotope ratio analysis to profiling methylamphetamine: Challenges to maintain comparability -- M. Marzano -- Realization of the farad from the quantum Hall effect with a fully digital bridge: Progress report -- M. Marzano, M. Kruskopf and A.R. Panna -- Bridge on a chip: Realization of a Kelvin bridge based on quantum Hall elements for resistance calibration -- B. Fang, H. Le Goff, B. Chupin, L. Lorini, M. Abgrall, P. Blonde, D. Rovera, P. Tuckey, P. Uhrich, J. Achkar, J. Guena, S. Zhang, N. Lucic, R. Le Tagart, Y. Le Coq, S. Bize, H. Alvarez-Martinez, N. Galland, S. Seidelin, A. Ferrier and P. Goldner -- From atomic fountains to ultra-stable lasers -- I. Murataj and F. Ferrarese Lupi -- Hyperbolic metamaterials by directed self-assembly of block copolymers -- Nompumelelo Leshabane, James Tshilongo, Shadung J. Moja, Napo G. Ntsasa, Gumani Mphaphuli and Mudalo I. Jozela -- Improved measurement capabilities for hydrogen sulphide reference gas mixtures in South Africa -- A. Sacco and A.M. Rossi -- Metrological aspects of tip-enhanced Raman spectroscopy -- Azure Hansen, Yun-Jhih Chen, John E. Kitching and Elizabeth A. Donley -- Point-source atom interferometer gyroscope -- F. Berto and C. Sias -- Prospects for single-photon sideband cooling of fermionic lithium -- Douglas G. Bopp, Matthew T. Hummon, Songbai Kang, John Kitching, Qing Li, Daron A. Westly, Sangsik Kim, Kartik Srinivasan and Vladimir Aksyuk -- Chip-scale wavelength standards -- List of participants.
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| 650 |
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0 |
|a Metrology.
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| 650 |
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0 |
|a Metrology--Congresses.
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| 700 |
1 |
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|a Wiersma, D. S.
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| 700 |
1 |
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|a Williams, C. J.
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| 776 |
0 |
8 |
|i Print version:
|a Milton, M. J. T.
|t New Frontiers for Metrology: from Biology and Chemistry to Quantum and Data Science
|d : IOS Press, Incorporated,c2021
|z 9781643682464
|
| 830 |
|
0 |
|a Proceedings of the International School of Physics Enrico Fermi Ser.
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| 856 |
4 |
0 |
|u https://ebookcentral.proquest.com/lib/holycrosscollege-ebooks/detail.action?docID=29070502
|y Click for online access
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| 903 |
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|a EBC-AC
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| 994 |
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|a 92
|b HCD
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