Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces

Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces / Saibal Basu, Surendra Singh.

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

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Bibliographic Details
Main Authors:	Basu, Saibal (Author), Singh, Surendra (Ph. D. in physics) (Author)
Format:	eBook
Language:	English
Published:	Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Subjects:	Thin films > Optical properties. Neutrons > Scattering. X-rays > Scattering. Reflection (Optics) x-ray scattering. reflections (perceived properties) Atomic & molecular physics. SCIENCE / Physics / Magnetism. Neutrons > Scattering Thin films > Optical properties X-rays > Scattering
Online Access:	Click for online access

Description
Summary:	This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.
Item Description:	"Version: 20221201"--Title page verso.
Physical Description:	1 online resource : illustrations (some color).
Audience:	Research students and institutions that are carrying out work in thin film structure and magnetism.
Bibliography:	Includes bibliographical references.
ISBN:	9780750346955 0750346957 0750346949 9780750346948
Source of Description, Etc. Note:	Title from PDF title page (viewed on January 9, 2023).
Biographical or Historical Data:	Saibal Basu carried out research in the field of neutron scattering and neutron instrumentation at Dhruva reactor in India for more than three decades. Surendra Singh is a scientist at the Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai.