Description
Summary: | This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.
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Item Description: | "Version: 20221201"--Title page verso. |
Physical Description: | 1 online resource : illustrations (some color). |
Audience: | Research students and institutions that are carrying out work in thin film structure and magnetism. |
Bibliography: | Includes bibliographical references. |
ISBN: | 9780750346955 0750346957 0750346949 9780750346948 |
Source of Description, Etc. Note: | Title from PDF title page (viewed on January 9, 2023). |
Biographical or Historical Data: | Saibal Basu carried out research in the field of neutron scattering and neutron instrumentation at Dhruva reactor in India for more than three decades. Surendra Singh is a scientist at the Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai. |