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|a 10.1007/978-981-19-6845-7
|2 doi
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|z (OCoLC)1369523430
|z (OCoLC)1369665844
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|b I57 2023
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|a HCDD
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|a In-situ transmission electron microscopy /
|c Litao Sun, Tao Xu, Ze Zhang, editors.
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|a Singapore :
|b Springer,
|c [2023]
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|a 1 online resource
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|a text
|b txt
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|a computer
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|a Intro -- Foreword -- Preface -- Contents -- 1 Introduction to In-Situ Transmission Electron Microscopy -- 1.1 Definition of In-Situ Transmission Electron Microscopy -- 1.2 A Brief History of In-Situ Transmission Electron Microscopy -- 1.3 Modern In-Situ Transmission Electron Microscopy -- 1.4 Challenges and Opportunities -- 1.5 Concept of This Book -- References -- 2 Electron Beam Irradiation Effects and In-Situ Irradiation of Nanomaterials -- 2.1 A Brief History of In-Situ Electron Irradiation -- 2.2 Fundamental Electron Irradiation Effects -- 2.2.1 Atom Displacements
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|a 2.2.2 Surface Sputtering -- 2.2.3 Electrostatic Charging -- 2.2.4 Radiolysis -- 2.2.5 Electron Beam Heating -- 2.2.6 Electron Beam-Induced Deposition -- 2.3 Electron Irradiation-Induced Processes in Nanomaterials -- 2.3.1 The Dynamics of Defects Under Electron Beam Irradiation -- 2.3.2 Irradiation-Induced Phase Transformations -- 2.3.3 Nucleation and Growth of Nanostructures Under Irradiation -- 2.3.4 Fabrication of New Structures Under Irradiation -- 2.3.5 Deformation of Nanostructures Under Electron Irradiation -- 2.4 Conclusions and Outlook -- References -- 3 In-Situ Nanomechanical TEM
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|a 3.1 A Brief History of In Situ Nanomechanical TEM -- 3.2 Current In Situ TEM-based Mechanical Testing Techniques -- 3.2.1 Thin Film Straining Technique -- 3.2.2 TEM Grid Technique -- 3.2.3 Thermal-Bimetallic-Based Technique -- 3.2.4 MEMS-Based Techniques -- 3.2.5 Sequential Fabrication-Testing Technique -- 3.3 Typical Applications -- 3.3.1 Deformation of Metallic Nanowires -- 3.3.2 Deformation of Nanocrystalline Metals -- 3.3.3 Deformation at Grain Boundaries -- 3.3.4 Deformation Under Elevated Temperature -- 3.3.5 Deformation of "Brittle" Materials -- 3.4 Outlook -- References
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|a 4 In-Situ Heating TEM -- 4.1 A Brief History of In-Situ Heating TEM -- 4.2 Current In-Situ Heating TEM Technologies -- 4.2.1 Operation Mode -- 4.2.2 Type of Heating Holders -- 4.2.3 Microheaters -- 4.2.4 Synergy with Heating -- 4.3 Research Based on In-Situ Heating TEM -- 4.3.1 Material Growth -- 4.3.2 Sublimation and Surface Energy -- 4.3.3 Failure Analysis -- 4.3.4 Annealing and Phase Transitions -- 4.3.5 Catalysis and Battery -- 4.3.6 Solid-State Amorphization and Crystallization -- 4.3.7 Degradation of Perovskite Solar Cells -- 4.4 Conclusions and Outlook -- References
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|a 5 In-Situ Biasing TEM -- 5.1 Introduction -- 5.2 Electrical Measurements -- 5.2.1 Field Emission of Carbon Nanotubes and Nanowires -- 5.2.2 Quantum Conductance of Au Atomic Chain and MWCNT -- 5.2.3 Electrical and Mechanical Coupling -- 5.2.4 Ferroelectric Domain Switching -- 5.2.5 Resistive Switching -- 5.3 Electrothermal Behaviors and Measurements -- 5.3.1 Thermal Parameter Measurements -- 5.3.2 Joule Heating of Nanocarbon -- 5.4 In Situ TEM Nanoelectrochemistry -- 5.4.1 IL Cell -- 5.4.2 Solid Cell -- 5.4.3 In Situ Liquid Cell -- 5.5 Perspective -- References -- 6 In-Situ Optical TEM
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|a This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a samples response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.
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|a Online resource; title from PDF title page (SpringerLink, viewed February 15, 2023).
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|a Transmission electron microscopes.
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|a Transmission electron microscopes
|2 fast
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|a Sun, Litao.
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|a Xu, Tao.
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|a Zhang, Ze,
|d 1953-
|1 https://id.oclc.org/worldcat/entity/E39PCjBmwgyhdyctdX4QqgCG73
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|c Original
|z 9811968446
|z 9789811968440
|w (OCoLC)1342623768
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| 856 |
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|u https://holycross.idm.oclc.org/login?auth=cas&url=https://link.springer.com/10.1007/978-981-19-6845-7
|y Click for online access
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|a SPRING-ALL2023
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|a 92
|b HCD
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