Differentiated layout styles for MOSFETs : electrical behavior in harsh environments / Salvador Pinillos Gimenez, Egon Henrique Salerno Galembeck.

This book describes in detail the semiconductor physics and the effects of the high temperatures and ionizing radiations in the electrical behavior of the Metal-OxideSemiconductor Field Effect Transistors (MOSFETs), implemented with the first and second generations of the differentiated layout style...

Full description

Saved in:
Bibliographic Details
Main Authors: Gimenez, Salvador Pinillos, 1962- (Author), Galembeck, Egon Henrique Salerno (Author)
Format: eBook
Language:English
Published: Cham, Switzerland : Springer, 2023.
Subjects:
Online Access:Click for online access

MARC

LEADER 00000cam a22000007i 4500
001 on1379207174
003 OCoLC
005 20240623213015.0
006 m o d
007 cr cnu---unuuu
008 230516s2023 sz a ob 001 0 eng d
040 |a GW5XE  |b eng  |e rda  |e pn  |c GW5XE  |d YDX  |d EBLCP  |d UKAHL  |d OCLCF  |d OCLCQ  |d YDX  |d OCLCO  |d OCLCL 
019 |a 1378708459  |a 1378936111 
020 |a 9783031290862  |q (electronic bk.) 
020 |a 3031290860  |q (electronic bk.) 
020 |z 3031290852 
020 |z 9783031290855 
024 7 |a 10.1007/978-3-031-29086-2  |2 doi 
035 |a (OCoLC)1379207174  |z (OCoLC)1378708459  |z (OCoLC)1378936111 
050 4 |a TK7871.95  |b .G56 2023 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
049 |a HCDD 
100 1 |a Gimenez, Salvador Pinillos,  |d 1962-  |e author.  |1 https://id.oclc.org/worldcat/entity/E39PCjJqT9QwJxK4Y4v9pxQtTd 
245 1 0 |a Differentiated layout styles for MOSFETs :  |b electrical behavior in harsh environments /  |c Salvador Pinillos Gimenez, Egon Henrique Salerno Galembeck. 
264 1 |a Cham, Switzerland :  |b Springer,  |c 2023. 
300 |a 1 online resource (230 pages) :  |b illustrations (black and white, and colour). 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
505 0 |a Chapter 1. Introduction -- Chapter 2. Basic concepts of the semiconductor physics -- Chapter 3. The electrical characteristics of the semiconductor at high temperatures -- Chapter 4. The MOSFET -- Chapter 5. The First Generation of the Unconventional Layout Styles for MOSFETs -- Chapter 6. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs -- Chapter 7. The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of MOSFETs -- Chapter 8. The High Temperature Effects in Electrical Parameters of Mosfets and the Results Obtained of the First and Second Generation. 
520 |a This book describes in detail the semiconductor physics and the effects of the high temperatures and ionizing radiations in the electrical behavior of the Metal-OxideSemiconductor Field Effect Transistors (MOSFETs), implemented with the first and second generations of the differentiated layout styles. The authors demonstrate a variety of innovative layout styles for MOSFETs, enabling readers to design analog and RF MOSFETs that operate in a high-temperature wide range and an ionizing radiation environment with high electrical performance and reduced die area. Enables improved electrical performance, frequency response, energy efficiency, and die area usage of analog and RF CMOS ICs; Describes innovative layout styles for MOSFETs that dont entail an additional cost in manufacturing; Discusses the design of analog and RF MOSFETs that operate effectively in a high-temperature wide range and an ionizing radiation environment. 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
650 0 |a Metal oxide semiconductor field-effect transistors. 
650 7 |a Metal oxide semiconductor field-effect transistors  |2 fast 
700 1 |a Galembeck, Egon Henrique Salerno,  |e author. 
776 0 8 |i Print version:  |a GIMENEZ, SALVADOR PINILLOS. GALEMBECK, EGON HENRIQUE SALERNO.  |t DIFFERENTIATED LAYOUT STYLES FOR MOSFETS.  |d [Place of publication not identified] : SPRINGER INTERNATIONAL PU, 2023  |z 3031290852  |w (OCoLC)1371140021 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://link.springer.com/10.1007/978-3-031-29086-2  |y Click for online access 
903 |a SPRING-ALL2023 
994 |a 92  |b HCD