The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale

The measurement of intelligence : an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale / by Lewis M. Terman.

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Bibliographic Details
Main Author: Terman, Lewis Madison, 1877-1956
Format: Book
Language:English
Published: Boston : Houghton Mifflin Company, c1916.
Series:Riverside textbooks in education.
Subjects:
Intelligence tests.
Binet-Simon Test.
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Dinand Library

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Call Number: LB1131 .T3
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Copy 2 Available

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