$Quantitative X-ray diffractometry$

Quantitative X-ray diffractometry / Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.

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Bibliographic Details
Main Author:	Zevin, Lev S.
Other Authors:	Kimmel, Giora, Mureinik, Inez
Format:	Book
Language:	English
Published:	New York : Springer, c1995.
Subjects:	X-rays > Diffraction. X-rays > Diffraction > Industrial applications.

Holdings details from Science Library
Call Number:	QC482.D5 Z48 1995
Copy 1	Available

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