Atomic force microscopy/scanning tunneling microscopy / edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody.

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Bibliographic Details
Corporate Author:	U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H., Bray, Mona T., Lightbody, Marcia L.
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Plenum Press, c1994.
Subjects:	Atomic force microscopy. Scanning tunneling microscopy.

Holdings details from Science Library
Call Number:	QH212.A78 A86 1994
Status:	Available

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