Atomic force microscopy/scanning tunneling microscopy

Atomic force microscopy/scanning tunneling microscopy / edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody.

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Bibliographic Details
Corporate Author: U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors: Cohen, Samuel H., Bray, Mona T., Lightbody, Marcia L.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, c1994.
Subjects:
Atomic force microscopy.
Scanning tunneling microscopy.
Description
Item Description:"Proceedings of the First U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 8-10, 1993, in Natick, Massachusetts"--T.p. verso.
Physical Description:x, 453 p. : ill. ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306448904

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