Testing Static Random Access Memories Defects, Fault Models and Test Patterns

Testing Static Random Access Memories Defects, Fault Models and Test Patterns / by Said Hamdioui.

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers...

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Bibliographic Details
Main Author: Hamdioui, Said (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2004.
Edition:1st ed. 2004.
Series:Frontiers in Electronic Testing, 26
Springer eBook Collection.
Subjects:
Electronic circuits.
Electrical engineering.
Materials science.
Optical materials.
Electronic materials.
Electronic resources (E-books)
Online Access:Click to view e-book
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