High-Resolution Electron Microscopy for Materials Science

High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo, Hiraga Kenji.

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of...

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Bibliographic Details
Main Authors: Shindo, Daisuke (Author), Kenji, Hiraga (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Tokyo : Springer Japan : Imprint: Springer, 1998.
Edition:1st ed. 1998.
Series:Springer eBook Collection.
Subjects:
Materials science.
Physical measurements.
Measurement   .
Electronic resources (E-books)
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