EXAFS: Basic Principles and Data Analysis

EXAFS: Basic Principles and Data Analysis by Boon K. Teo.

The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to the recognition of the structural content of this tec...

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Bibliographic Details
Main Author: Teo, Boon K. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1986.
Edition:1st ed. 1986.
Series:Inorganic Chemistry Concepts, 9
Springer eBook Collection.
Subjects:
Inorganic chemistry.
Analytical chemistry.
Physical chemistry.
Lasers.
Photonics.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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