Semiconductor Device Reliability

Semiconductor Device Reliability edited by A. Christou, B.A. Unger.

This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further exp...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Christou, A. (Editor), Unger, B.A (Editor)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 1990.
Edition:1st ed. 1990.
Series:Nato Science Series E:, Applied Sciences, 175
Springer eBook Collection.
Subjects:
Electronics.
Microelectronics.
Electrical engineering.
Quality control.
Reliability.
Industrial safety.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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