Field-Ion Microscopy

Field-Ion Microscopy by R. Wagner.

Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the...

Full description

Saved in:
Bibliographic Details
Main Author: Wagner, R. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1982.
Edition:1st ed. 1982.
Series:Crystals, Growth, Properties, and Applications, 6
Springer eBook Collection.
Subjects:
Inorganic chemistry.
Solid state physics.
Spectroscopy.
Microscopy.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Status: Available

Similar Items