An Artificial Intelligence Approach to Test Generation

An Artificial Intelligence Approach to Test Generation by Narinder Singh.

I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to t...

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Bibliographic Details
Main Author: Singh, Narinder (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1987.
Edition:1st ed. 1987.
Series:The Springer International Series in Engineering and Computer Science, 19
Springer eBook Collection.
Subjects:
Electronic circuits.
Artificial intelligence.
Electrical engineering.
Computer-aided engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
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Call Number: E-Book
Status: Available

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