Optical Characterization of Epitaxial Semiconductor Layers

Optical Characterization of Epitaxial Semiconductor Layers edited by Günther Bauer, Wolfgang Richter.

The last decade has witnessed an explosive development in the growth of expitaxial layers and structures with atomic-scale dimensions. This progress has created new demands for the characterization of those stuctures. Various methods have been refined and new ones developed with the main emphasis on...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Bauer, Günther (Editor), Richter, Wolfgang (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1996.
Edition:1st ed. 1996.
Series:Springer eBook Collection.
Subjects:
Semiconductors.
Optical materials.
Electronic materials.
Materials—Surfaces.
Thin films.
Lasers.
Photonics.
Electronic resources (E-books)
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