Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits by Christopher Michael, Mohammed Ismail.

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Compute...

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Bibliographic Details
Main Authors: Michael, Christopher (Author), Ismail, Mohammed (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1993.
Edition:1st ed. 1993.
Series:The Springer International Series in Engineering and Computer Science, 211
Springer eBook Collection.
Subjects:
Computer-aided engineering.
Electrical engineering.
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