Semiconductor Interfaces at the Sub-Nanometer Scale

Semiconductor Interfaces at the Sub-Nanometer Scale edited by H.W.M Salemink, M.D. Pashley.

The Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Sub-Nanometer Scale was held from 31 August to 2 September, 1992, in Riva del Garda. Italy. The aim of the workshop was to bring together experts in different aspects of the study of semiconductor interfaces...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Salemink, H.W.M (Editor), Pashley, M.D (Editor)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 1993.
Edition:1st ed. 1993.
Series:Nato Science Series E:, Applied Sciences, 243
Springer eBook Collection.
Subjects:
Materials—Surfaces.
Thin films.
Optical materials.
Electronic materials.
Materials science.
Solid state physics.
Spectroscopy.
Microscopy.
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