Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by M. Bushnell, Vishwani Agrawal.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...

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Bibliographic Details
Main Authors: Bushnell, M. (Author), Agrawal, Vishwani (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2002.
Edition:1st ed. 2002.
Series:Frontiers in Electronic Testing, 17
Springer eBook Collection.
Subjects:
Electronics.
Microelectronics.
Computers.
Electronic circuits.
Electrical engineering.
Computer-aided engineering.
Electronic resources (E-books)
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Status: Available

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