CTL for Test Information of Digital ICs

CTL for Test Information of Digital ICs by Rohit Kapur.

CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test informatio...

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Bibliographic Details
Main Author: Kapur, Rohit (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2002.
Edition:1st ed. 2002.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Electrical engineering.
Computer-aided engineering.
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