Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State

Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State / by Andreas Rosenauer.

This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...

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Bibliographic Details
Main Author: Rosenauer, Andreas (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2003.
Edition:1st ed. 2003.
Series:Springer Tracts in Modern Physics, 182
Springer eBook Collection.
Subjects:
Condensed matter.
Solid state physics.
Spectroscopy.
Microscopy.
Physical measurements.
Measurement   .
Materials science.
Electronic resources (E-books)
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