Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon by Peter Pichler.

Basically all properties of semiconductor devices are influenced by the distribution of point defects in their active areas. This book contains the first comprehensive review of the properties of intrinsic point defects, acceptor and donor impurities, isovalent atoms, chalcogens, and halogens in sil...

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Bibliographic Details
Main Author: Pichler, Peter (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Vienna : Springer Vienna : Imprint: Springer, 2004.
Edition:1st ed. 2004.
Series:Computational Microelectronics,
Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.