Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits by J. Altet, Antonio Rubio.

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They wo...

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Bibliographic Details
Main Authors: Altet, J. (Author), Rubio, Antonio (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2002.
Edition:1st ed. 2002.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Electrical engineering.
Manufactures.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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