Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits by J. Altet, Antonio Rubio.

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They wo...

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Bibliographic Details
Main Authors:	Altet, J. (Author), Rubio, Antonio (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	New York, NY : Springer US : Imprint: Springer, 2002.
Edition:	1st ed. 2002.
Series:	Springer eBook Collection.
Subjects:	Electronic circuits. Electrical engineering. Manufactures. Electronic resources (E-books)
Online Access:	Click to view e-book
Holy Cross Note:	Loaded electronically. Electronic access restricted to members of the Holy Cross Community.

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