Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.

The international market is very competitive for high-tech manufacturers to­ day. Achieving competitive quality and reliability for products requires leader­ ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date eng...

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Bibliographic Details
Main Authors: Way Kuo (Author), Wei-Ting Kary Chien (Author), Taeho Kim (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1998.
Edition:1st ed. 1998.
Series:Springer eBook Collection.
Subjects:
Manufactures.
Electrical engineering.
Optical materials.
Electronic materials.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
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Call Number: E-Book
Status: Available

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