Matching Properties of Deep Sub-Micron MOS Transistors

Matching Properties of Deep Sub-Micron MOS Transistors by Jeroen A. Croon, Willy M Sansen, Herman E. Maes.

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...

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Bibliographic Details
Main Authors: Croon, Jeroen A. (Author), Sansen, Willy M. (Author), Maes, Herman E. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2005.
Edition:1st ed. 2005.
Series:The Springer International Series in Engineering and Computer Science, 851
Springer eBook Collection.
Subjects:
Electronic circuits.
Physics.
Electronics.
Microelectronics.
Engineering.
Electrical engineering.
Electronic resources (E-books)
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