Confocal Raman Microscopy edited by Jan Toporski, Thomas Dieing, Olaf Hollricher.

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman im...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Toporski, Jan (Editor), Dieing, Thomas (Editor), Hollricher, Olaf (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:2nd ed. 2018.
Series:Springer Series in Surface Sciences, 66
Springer eBook Collection.
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Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.