New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy by Kenichi Shimizu, Tomoaki Mitani.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize...

Full description

Saved in:
Bibliographic Details
Main Authors: Shimizu, Kenichi (Author), Mitani, Tomoaki (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Springer Series in Surface Sciences, 45
Springer eBook Collection.
Subjects:
Materials—Surfaces.
Thin films.
Physical measurements.
Measurement   .
Solid state physics.
Spectroscopy.
Microscopy.
Nanotechnology.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Status: Available

Similar Items