Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings / edited by Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They wer...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Bai, Xiao (Editor), Hancock, Edwin R. (Editor), Ho, Tin Kam (Editor), Wilson, Richard C. (Editor), Biggio, Battista (Editor), Robles-Kelly, Antonio (Editor)
Format:	eBook
Language:	English
Published:	Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:	1st ed. 2018.
Series:	Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 11004 Springer eBook Collection.
Subjects:	Artificial intelligence. Pattern recognition. Optical data processing. Algorithms. Computer science—Mathematics. Data structures (Computer science). Electronic resources (E-books)
Online Access:	Click to view e-book
Holy Cross Note:	Loaded electronically. Electronic access restricted to members of the Holy Cross Community.