Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and conti...

Full description

Saved in:
Bibliographic Details
Main Authors: Tan, Cher Ming (Author), Li, Wei (Author), Gan, Zhenghao (Author), Hou, Yuejin (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: London : Springer London : Imprint: Springer, 2011.
Edition:1st ed. 2011.
Series:Springer Series in Reliability Engineering,
Springer eBook Collection.
Subjects:
Quality control.
Reliability.
Industrial safety.
Computational intelligence.
Electronics.
Microelectronics.
Optical materials.
Electronic materials.
Partial differential equations.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Status: Available

Similar Items