Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications edited by Yosi Shacham-Diamand, Tetsuya Osaka, Madhav Datta, Takayuki Ohba.

Advanced Nanoscale ULSI Interconnects: Fundamental and Applications brings a comprehensive description of copper based interconnect technology for Ultra Large Scale Integration (ULSI) technology to Integrated Circuit (ICs) application. This book reviews the basic technologies used today for the copp...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Shacham-Diamand, Yosi (Editor), Osaka, Tetsuya (Editor), Datta, Madhav (Editor), Ohba, Takayuki (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Series:Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.

MARC

LEADER 00000nam a22000005i 4500
001 b3267876
003 MWH
005 20191025032600.0
007 cr nn 008mamaa
008 100301s2009 xxu| s |||| 0|eng d
020 |a 9780387958682 
024 7 |a 10.1007/978-0-387-95868-2  |2 doi 
035 |a (DE-He213)978-0-387-95868-2 
050 4 |a E-Book 
072 7 |a PNRH  |2 bicssc 
072 7 |a SCI013050  |2 bisacsh 
072 7 |a PNRH  |2 thema 
245 1 0 |a Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications  |h [electronic resource] /  |c edited by Yosi Shacham-Diamand, Tetsuya Osaka, Madhav Datta, Takayuki Ohba. 
250 |a 1st ed. 2009. 
264 1 |a New York, NY :  |b Springer New York :  |b Imprint: Springer,  |c 2009. 
300 |a XX, 552 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer eBook Collection 
505 0 |a Challenges in ULSI Interconnects - Introduction to the Book -- Technology Background -- MOS Device and Interconnects Scaling Physics -- Interconnects in ULSI Systems: Cu Interconnects Electrical Performance -- Electrodeposition -- Electrophoretic Deposition -- Wafer-Level 3D Integration for ULSI Interconnects -- Interconnect Materials -- Diffusion Barriers for Ultra-Large-Scale Integrated Copper Metallization -- Silicides -- Materials for ULSI metallization - Overview of Electrical Properties -- Low-? Materials and Development Trends -- Electrical and Mechanical Characteristics of Air-Bridge Cu Interconnects -- ALD Seed Layers for Plating and Electroless Plating -- Deposition Processes for ULSI Interconnects -- Electrochemical Processes for ULSI Interconnects -- Atomic Layer Deposition (ALD) Processes for ULSI Manufacturing -- Electroless Deposition Approaching the Molecular Scale -- Modeling -- Modeling Superconformal Electrodeposition Using an Open Source PDE Solver -- Electrochemical Process Integration -- to Electrochemical Process Integration for Cu Interconnects -- Damascene Concept and Process Steps -- Advanced BEOL Technology Overview -- Lithography for Cu Damascene Fabrication -- Physical Vapor Deposition Barriers for Cu metallization - PVD Barriers -- Low-k Dielectrics -- CMP for Cu Processing -- Electrochemical View of Copper Chemical-Mechanical Polishing (CMP) -- Copper Post-CMP Cleaning -- Electrochemical Processes and Tools -- Electrochemical Processing Tools for Advanced Copper Interconnects: An Introduction -- Electrochemical Deposition Processes and Tools -- Electroless Deposition Processes and Tools -- Tools for Monitoring and Control of Bath Components -- Processes and Tools for Co Alloy Capping -- Advanced Planarization Techniques -- Metrology -- Integrated Metrology (IM) History at a Glance -- Thin Film Metrology - X-ray Methods -- Summary and Foresight -- Emerging Nanoscale Interconnect Processing Technologies: Fundamental and Practice -- Self-Assembly of Short Aromatic Peptides: From Amyloid Fibril Formation to Nanotechnology. 
520 |a Advanced Nanoscale ULSI Interconnects: Fundamental and Applications brings a comprehensive description of copper based interconnect technology for Ultra Large Scale Integration (ULSI) technology to Integrated Circuit (ICs) application. This book reviews the basic technologies used today for the copper metallization of ULSI applications: deposition and planarization. It describes the materials used, their properties, and the way they are all integrated, specifically in regard to the copper integration processes and electrochemical processes in the nanoscale regime. The book also presents various novel nanoscale technologies that will link modern nanoscale electronics to future nanoscale based systems. This diverse, multidisciplinary volume will appeal to process engineers in the microelectronics industry; universities with programs in ULSI design, microelectronics, MEMS and nanoelectronics; and professionals in the electrochemical industry working with materials, plating and tool vendors. 
590 |a Loaded electronically. 
590 |a Electronic access restricted to members of the Holy Cross Community. 
650 0 |a Electrochemistry. 
650 0 |a Materials science. 
650 0 |a Chemical engineering. 
650 0 |a Electrical engineering. 
650 0 |a Nanotechnology. 
690 |a Electronic resources (E-books) 
700 1 |a Shacham-Diamand, Yosi.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Osaka, Tetsuya.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Datta, Madhav.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Ohba, Takayuki.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
830 0 |a Springer eBook Collection. 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://doi.org/10.1007/978-0-387-95868-2  |3 Click to view e-book  |t 0 
907 |a .b32678769  |b 04-18-22  |c 02-26-20 
998 |a he  |b 02-26-20  |c m  |d @   |e -  |f eng  |g xxu  |h 0  |i 1 
912 |a ZDB-2-CMS 
950 |a Chemistry and Materials Science (Springer-11644) 
902 |a springer purchased ebooks 
903 |a SEB-COLL 
945 |f  - -   |g 1  |h 0  |j  - -   |k  - -   |l he   |o -  |p $0.00  |q -  |r -  |s b   |t 38  |u 0  |v 0  |w 0  |x 0  |y .i21810382  |z 02-26-20 
999 f f |i 185db65d-ecf3-5338-852b-e562f573b0bd  |s d20ac4f8-4086-5c3c-8ae1-08ece73f2e68  |t 0 
952 f f |p Online  |a College of the Holy Cross  |b Main Campus  |c E-Resources  |d Online  |t 0  |e E-Book  |h Library of Congress classification  |i Elec File