Scanning Microscopy for Nanotechnology Techniques and Applications

Scanning Microscopy for Nanotechnology Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Zhou, Weilie (Editor), Wang, Zhong Lin (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2007.
Edition:1st ed. 2007.
Series:Springer eBook Collection.
Subjects:
Nanotechnology.
Materials science.
Optical materials.
Electronic materials.
Physical measurements.
Measurement   .
Electronic resources (E-books)
Online Access:Click to view e-book
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Call Number: E-Book
Status: Available

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