Electrical Atomic Force Microscopy for Nanoelectronics

Electrical Atomic Force Microscopy for Nanoelectronics edited by Umberto Celano.

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabricatio...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Celano, Umberto (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:1st ed. 2019.
Series:NanoScience and Technology,
Springer eBook Collection.
Subjects:
Spectroscopy.
Microscopy.
Materials science.
Electronics.
Microelectronics.
Optical materials.
Electronic materials.
Nanoscale science.
Nanoscience.
Nanostructures.
Nanotechnology.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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