Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK / edited by A.G. Cullis, John L. Hutchison.

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Cullis, A.G (Editor), Hutchison, John L. (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2005.
Edition:1st ed. 2005.
Series:Springer Proceedings in Physics, 107
Springer eBook Collection.
Subjects:
Materials science.
Electronics.
Microelectronics.
Electronic circuits.
Solid state physics.
Spectroscopy.
Microscopy.
Physical measurements.
Measurement   .
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