Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry of Functional Organic Surfaces and Films edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces,...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Hinrichs, Karsten (Editor), Eichhorn, Klaus-Jochen (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Springer Series in Surface Sciences, 52
Springer eBook Collection.
Subjects:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Physical chemistry.
Lasers.
Photonics.
Materials science.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.

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