Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS / by Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis.

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

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Bibliographic Details
Main Authors: Posser, Gracieli (Author), Sapatnekar, Sachin S. (Author), Reis, Ricardo (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2017.
Edition:1st ed. 2017.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Microprocessors.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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