Test Pattern Generation using Boolean Proof Engines

Test Pattern Generation using Boolean Proof Engines by Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille.

After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...

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Bibliographic Details
Main Authors: Drechsler, Rolf (Author), Eggersglüß, Stephan (Author), Fey, Görschwin (Author), Tille, Daniel (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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