Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology by Manjul Bhushan, Mark B. Ketchen.

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has...

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Bibliographic Details
Main Authors: Bhushan, Manjul (Author), Ketchen, Mark B. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2011.
Edition:1st ed. 2011.
Series:Springer eBook Collection.
Subjects:
Electronics.
Microelectronics.
Optical materials.
Electronic materials.
Electronic circuits.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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