Extreme Statistics in Nanoscale Memory Design

Extreme Statistics in Nanoscale Memory Design edited by Amith Singhee, Rob A. Rutenbar.

Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme stat...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Singhee, Amith (Editor), Rutenbar, Rob A. (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Integrated Circuits and Systems,
Springer eBook Collection.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Electronic resources (E-books)
Online Access:Click to view e-book
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Call Number: E-Book
Status: Available

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