Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy

Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy / by José A. Gutierrez, Brian S.R. Armstrong.

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations....

Full description

Saved in:
Bibliographic Details
Main Authors: Gutierrez, José A. (Author), Armstrong, Brian S.R (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: London : Springer London : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Springer eBook Collection.
Subjects:
Optical data processing.
Control engineering.
Robotics.
Mechatronics.
Remote sensing.
Signal processing.
Image processing.
Speech processing systems.
Radiology.
Statistics .
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Copy 1 Available

Similar Items