Integrated Circuit Test Engineering Modern Techniques / by Ian A. Grout.

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...

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Bibliographic Details
Main Author: Grout, Ian A. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: London : Springer London : Imprint: Springer, 2006.
Edition:1st ed. 2006.
Series:Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.