Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors / by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim.

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...

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Bibliographic Details
Main Authors: Im, Seongil (Author), Chang, Youn-Gyoung (Author), Kim, Jae Hoon (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:SpringerBriefs in Physics,
Springer eBook Collection.
Subjects:
Electronic circuits.
Solid state physics.
Lasers.
Photonics.
Physical measurements.
Measurement   .
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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