Circuit Design for Reliability edited by Ricardo Reis, Yu Cao, Gilson Wirth.

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ran...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Reis, Ricardo (Editor), Cao, Yu (Editor), Wirth, Gilson (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2015.
Edition:1st ed. 2015.
Series:Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.