Circuit Design for Reliability

Circuit Design for Reliability edited by Ricardo Reis, Yu Cao, Gilson Wirth.

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ran...

Full description

Saved in:
Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Reis, Ricardo (Editor), Cao, Yu (Editor), Wirth, Gilson (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2015.
Edition:1st ed. 2015.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Quality control.
Reliability.
Industrial safety.
Computer-aided engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Introduction
  • Recent Trends in Bias Temperature Instability
  • Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability
  • Atomistic Simulations on Reliability
  • On-chip characterization of statistical device degradation
  • Circuit Resilience Roadmap
  • Layout Aware Electromigration Analysis of Power/Ground Networks
  • Power-Gating for Leakage Control and Beyond
  • Soft Error Rate and Fault Tolerance Techniques for FPGAs.

Similar Items