Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization

Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization / edited by Sascha Sadewasser, Thilo Glatzel.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Sadewasser, Sascha (Editor), Glatzel, Thilo (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Springer Series in Surface Sciences, 65
Springer eBook Collection.
Subjects:
Spectroscopy.
Microscopy.
Materials—Surfaces.
Thin films.
Nanotechnology.
Materials science.
Physical measurements.
Measurement   .
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