High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability by Stephan Eggersglüß, Rolf Drechsler.

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...

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Bibliographic Details
Main Authors: Eggersglüß, Stephan (Author), Drechsler, Rolf (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Microprocessors.
Electronic resources (E-books)
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