Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty.

This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable meth...

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Bibliographic Details
Main Authors: Tehranipoor, Mohammad (Author), Peng, Ke (Author), Chakrabarty, Krishnendu (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Computer software—Reusability.
Nanotechnology.
Electronic resources (E-books)
Online Access:Click to view e-book
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Call Number: E-Book
Status: Available

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