Scanning Electron Microscopy and X-Ray Microanalysis by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...
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Bibliographic Details
| Main Authors: |
Goldstein, Joseph I.
(Author),
Newbury, Dale E.
(Author),
Michael, Joseph R.
(Author),
Ritchie, Nicholas W.M
(Author),
Scott, John Henry J.
(Author),
Joy, David C.
(Author) |
|---|
| Corporate Author: |
SpringerLink (Online service) |
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| Format: | eBook
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| Language: | English |
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| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2018.
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| Edition: | 4th ed. 2018. |
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| Series: | Springer eBook Collection.
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| Subjects: | |
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| Online Access: | Click to view e-book
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| Holy Cross Note: | Loaded electronically.
Electronic access restricted to members of the Holy Cross Community. |
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