Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features

Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features by Von G. Samedi, Thèrése Bocklage.

This book provides cytopathologists a succinct but comprehensive reference covering common diagnostic dilemmas caused by normal, iatrogenic, inflammatory and reactive/reparative changes in cytology samples. This book will provide immediate access to these confounders, clearly illustrating key featur...

Full description

Saved in:
Bibliographic Details
Main Authors: Samedi, Von G. (Author), Bocklage, Thèrése (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edition:1st ed. 2016.
Series:Essentials in Cytopathology, 27
Springer eBook Collection.
Subjects:
Pathology.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Status: Available

Similar Items