Multi-run Memory Tests for Pattern Sensitive Faults

Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek.

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...

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Bibliographic Details
Main Author: Mrozek, Ireneusz (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:1st ed. 2019.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Microprocessors.
Electronics.
Microelectronics.
Electronic resources (E-books)
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